Items where Author is "Murti, W.B."

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Article

Yusof, H.H.M. and Soin, N. and Murti, W.B. (2015) HCI degradation effect on VDMOS transistor with geometric and process variations. International Journal of Applied Engineering Research, 10 (19). pp. 39880-39884. ISSN 0973-4562,

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