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Nguan Kong, T. S. and Alias, N. Ezaila and Hamzah, Afiq and Kamisian, Izam and Peng Tan, M.L. and Sheikh, U. Ullah and Abdul Wahab, Yasmin (2021) An efficient march (5n) FSM-based Memory Built-In Self Test (MBIST) architecture. In: 13th IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2021, 2 - 4 August 2021, Virtual, Kuala Lumpur.