Structural, optical and morphological properties of TiO2/Ag/TiO2 multilayer films

Hasan, M.M. and Haseeb, A.S. Md. Abdul and Saidur, Rahman and Masjuki, Haji Hassan and Johan, Mohd Rafie (2009) Structural, optical and morphological properties of TiO2/Ag/TiO2 multilayer films. AIP Conference Proceedings, 1136 (1). pp. 229-233. ISSN 0094-243X,

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In this investigation, TiO 2/Ag/TiO 2 multilayer-films were deposited on microscope glass slides with varying individual layer thicknesses by radio-frequency reactive magnetron sputtering. Prior to multilayer development, single layers of Ag and TiO 2 were deposited and characterized. All the films were prepared at a moderately high pressure at room temperature. It was found that single layer of TiO 2 showed anatase polycrystalline structure. It also exhibited high visible transmittance of above 80 and higher refractive index of 2.31 at a wavelength of 550 nm. The indirect optical band gap of the TiO 2 films was estimated as 3.39 eV. The Ag single layer films were found to be crystalline with a very high reflectance for IR (Infra-red) light. Finally, the multilayers have been deposited and characterized by X-ray diffraction, UV-visible-IR spectrophotometry, scanning electron microscopy and profilometry.

Item Type: Article
Additional Information: Cited By (since 1996): 2 Export Date: 6 December 2012 Source: Scopus doi: 10.1063/1.3160137 Language of Original Document: English Correspondence Address: Hasan, M. M.; Faculty of Engineering, University of Malaya, 50603 Kuala Lumpur, Malaysia References: Pulker, H.K., (1999) Coatings on Glass, Amsterdam, , Elsevier; Sung, Y.M., Kim, H.J., (2007) Thin Solid Films, 515, pp. 4996-4999; Okada, M., Tazawa, M., Jin, P., Yamada, Y., Yoshimura, K., (2006) Vacuum, 80, pp. 732-735; Wang, Z., Chen, Q., Cai, X., (2005) Appl. Surf. Sci., 239, pp. 262-267; Jin, P., Miao, L., Tanemura, S., Xu, G., Tazawa, M., Yoshimura, K., (2003) Appl. Surf. Sci., 212-213, pp. 775-781; Habibi, M.H., Talebian, N., Choi, J.H., (2007) Dyes and Pigments, 73, pp. 103-110; Yang, C., Fan, H., Xi, Y., Chen, J., Li, Z., (2008) Appl. Surf. Sci., 254, pp. 2685-2689; Tian, G., Wu, S., Shu, K., Qin, L., Shao, J., (2007) Appl. Surf. Sci., 253, pp. 8782-8787; Tavares, C.J., Vieira, J., Rebouta, L., Hungerford, G., Coutinho, P., Teixeira, V., Carneiro, J.O., Fernandes, A.J., (2007) Mater. Sci. and Eng., B, 138, pp. 139-143; Ghamsari, M.S., Bahramian, A.R., (2008) Mater. Lett., 62, pp. 361-364; Saini, K.K., Sharma, S.D., Chanderkant, Kar, M., Singh, D., Sharma, C.P., (2007) J. Non-Cryst. Solids, 353, pp. 2469-2473; Wang, Z., Helmersson, U., K�ll, P.O., (2002) Thin Solid Films, 405; Fu, J.K., Atanassov, G., Dai, Y.S., Tan, F.H., Mo, Z.Q., (1997) J. Non-Cryst. Solids, 218, pp. 403-410; Kawasaki, H., Ohshima, T., Yagyu, Y., Suda, Y., Khartsev, S.I., Grishin, A.M., (2008) J. Phys.: Conf. Series, 100, pp. 1-4. , 012038; Ray, S., Dutta, U., Das, R., Chatterjee, P., (2007) J. Phys. D: Appl. Phys., 40, pp. 2445-2451; Durrani, S.M.A., Khawaja, E.E., Al-Shukri, A.M., Al-Kuhaili, M.F., (2004) Energy and Buildings, 36, pp. 891-898; Swanepoel, R., (1983) J. Phys. E: Sci. Instr., 16, pp. 1214-1222; Hasan, M.M., Haseeb, A.S.M.A., Saidur, R., Masjuki, H.H., (2008) International J. of Chem. and Bimolecular Eng., 1, pp. 93-97; Guinier, A., (1963) X-ray Diffraction in Crystals, Imperfect Crystals and Amorphous Bodies, , New York: Dover publications; Kapaklis, V., Poulopoulus, P., Karautsos, V., Manouras, T., Politis, C., (2006) Thin Solid Films, 510, pp. 138-142 Sponsors: Universiti Teknologi MARA (UiTM); Nagoya Institute of Technology (NIT); Inst. Electron., Inf. Commun. Eng. IEICE; Institute of Materials Malaysia (IMM); Malaysian Assoc. Solid State Sci. Technol. MASS
Uncontrolled Keywords: Dielectric material, Multilayer coatings, Structural and optical properties
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
T Technology > TJ Mechanical engineering and machinery
Divisions: Faculty of Engineering
Depositing User: Mr Jenal S
Date Deposited: 08 Jul 2013 01:11
Last Modified: 14 Dec 2020 05:13

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