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Muthu, Bharathi Raj and Pushpa, Ewins Pon and Dhandapani, Vaithiyanathan and Jayaraman, Kamala and Vasanthakumar, Hemalatha and Oh, Won-Chun and Sagadevan, Suresh (2022) Design and analysis of soft error rate in FET/CNTFET based radiation hardened SRAM cell. Sensors, 22 (1). ISSN 1424-8220, DOI https://doi.org/10.3390/s22010033.