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Tabatabaeemoshiri, Pedram and Kumar, Narendra and Khairuddin, Anis Salwa Mohd and Ting, Daniel and Regeev, Vivek (2025) A Novel Approach to Test-Induced Defect Detection in Semiconductor Wafers, Using Graph-Based Semi-Supervised Learning (GSSL). IEEE Access, 13. pp. 21678-21694. ISSN 2169-3536, DOI https://doi.org/10.1109/ACCESS.2025.3535103.
