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Samsudin, Muhammad Esmed Alif and Yusuf, Yusnizam and Zainal, Norzaini and Abu Bakar, Ahmad Shuhaimi and Zollner, Christian and Iza, Michael and DenBaars, Steven P. (2021) Effect of nucleation layer thickness on reducing dislocation density in AlN layer for AlGaN-based UVC LED. Microelectronics International, 38 (3, SI). pp. 113-118. ISSN 1356-5362, DOI https://doi.org/10.1108/MI-02-2021-0012.
Zainal, Norzaini and Samsudin, Muhammad Esmed Alif and Md Taib, Muhamad Ikram and Ahmad, Mohd Anas and Shuhaimi, Ahmad (2020) Influence of post-ammonia annealing temperature on e-beam evaporation deposited GaN layer on patterned sapphire substrate. Superlattices and Microstructures, 148. p. 106722. ISSN 0749-6036, DOI https://doi.org/10.1016/j.spmi.2020.106722.
Md Taib, Muhamad Ikram and Samsudin, Muhammad Esmed Alif and Alias, Ezzah Azimah and Waheeda, S.N. and Ibrahim, Nurul Farhana and Shuhaimi, Ahmad and Zainal, Norzaini (2019) Surface and optical characteristics of polycrystalline GaN layer with different pores profile of porous GaAs/GaAs substrate. Materials Research Express, 6 (8). 085906. ISSN 2053-1591, DOI https://doi.org/10.1088/2053-1591/ab1dd4.
