Items where Author is "Mahmoud, Mohamed Mounir"

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Mahmoud, Mohamed Mounir and Soin, Norhayati (2019) A comparative study of lifetime reliability of planar MOSFET and FinFET due to BTI for the 16 nm CMOS technology node based on reaction-diffusion model. Microelectronics Reliability, 97. pp. 53-65. ISSN 0026-2714, DOI https://doi.org/10.1016/j.microrel.2019.03.007.

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