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Goh, Yi Sing and Haseeb, A. S. M. A. and Basirun, Wan Jeffrey and Wong, Yew Hoong and Sabri, Mohd Faizul Mohd and Low, Boon Yew (2023) Effects of concentration of adipic acid on the electrochemical migration of tin for printed circuit board assembly. Journal of Electronic Materials, 52 (3, SI). pp. 2236-2249. ISSN 0361-5235, DOI https://doi.org/10.1007/s11664-022-10155-2.
Lee, Ee Lynn and Goh, Yi Sing and Haseeb, A. S. M. A. and Wong, Yew Hoong and Sabri, Mohd Faizul Mohd and Low, Boon Yew (2023) Review-electrochemical migration in electronic materials: Factors affecting the mechanism and recent strategies for inhibition. Journal of The Electrochemical Society, 170 (2). ISSN 0013-4651, DOI https://doi.org/10.1149/1945-7111/acb61a.
Lee, Ee Lynn and Haseeb, A. S. M. A. and Basirun, Wan Jeffrey and Wong, Yew Hoong and Mohd Sabri, Mohd Faizul and Low, Boon Yew (2021) In-situ study of electrochemical migration of tin in the presence of bromide ion. Scientific Reports, 11 (1). ISSN 2045-2322, DOI https://doi.org/10.1038/s41598-021-95276-0.
