 | Up a level |
Goh, K.H. and Haseeb, A.S. Md. Abdul and Wong, Y.H. (2017) Lanthanide rare earth oxide thin film as an alternative gate oxide. Materials Science in Semiconductor Processing, 68. pp. 302-315. ISSN 1369-8001, DOI https://doi.org/10.1016/j.mssp.2017.06.037.
Goh, K.H. and Haseeb, A.S. Md. Abdul and Wong, Y.H. (2017) Structural characteristics of samarium oxynitride on silicon substrate. Journal of Alloys and Compounds, 722. pp. 729-739. ISSN 0925-8388, DOI https://doi.org/10.1016/j.jallcom.2017.06.179.
Goh, K.H. and Haseeb, A.S. Md. Abdul and Wong, Y.H. (2016) Effect of Oxidation Temperature on Physical and Electrical Properties of Sm2O3 Thin-Film Gate Oxide on Si Substrate. IEEE/TMS Journal of Electronic Materials, 45 (10). pp. 5302-5312. ISSN 0361-5235, DOI https://doi.org/10.1007/s11664-016-4694-z.
Goh, K.H. and Haseeb, A.S. Md. Abdul and Wong, Y.H. (2016) Physical and electrical properties of thermal oxidized Sm2O3 gate oxide thin film on Si substrate: Influence of oxidation durations. Thin Solid Films, 606. pp. 80-86. ISSN 0040-6090, DOI https://doi.org/10.1016/j.tsf.2016.03.051.
