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Odesanya, Kazeem Olabisi and Ahmad, Roslina and Andriyana, Andri and Bingol, Sedat and Cetinkaya, Ridvan and Wong, Yew Hoong (2022) Thermal characterization and stress analysis of Ho2O3 thin film on 4H-SiC substrate. Materials Science in Semiconductor Processing, 152. ISSN 1369-8001, DOI https://doi.org/10.1016/j.mssp.2022.107110.