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Baba, Tamana and Ahmed Siddiqui, Naseeb and Bte Saidin, Norazlina and Md Yusoff, Siti Harwani and Abdul Sani, Siti Fairus and Abdul Karim, Julia and Hasbullah, Nurul Fadzlin (2024) Radiation-induced degradation of silicon carbide MOSFETs: A review. Materials Science and Engineering: B, 300. ISSN 0921-5107, DOI https://doi.org/10.1016/j.mseb.2023.117096.
