Items where Author is "Abd Hadi, D."

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Hatta, S.F.W.M. and Soin, N. and Abd Hadi, D. and Zhang, J.F. (2010) NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process variations. Microelectronics Reliability, 50 (9-11, ). pp. 1283-1289.

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