Effect of filling gas on hard x-rays and ion beam emission from a 2 kJ plasma focus device

Behbahani, R. A. and Lee, S. and Xiao, C. (2021) Effect of filling gas on hard x-rays and ion beam emission from a 2 kJ plasma focus device. Radiation Effects and Defects in Solids, 176 (1-2, S). pp. 138-144. ISSN 1042-0150, DOI https://doi.org/10.1080/10420150.2021.1891064.

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The effects of the atomic number of the fill gas on hard x-ray and ion beam emission from a 2.2 kJ plasma focus were studied. Hydrogen, Nitrogen and Argon gases were used in the experiment. The anode voltage and discharge current were measured to calculate plasma inductance and to study the pinching regime in the three gases. The results showed that the heavier gas in the machine increases the duration of x-ray radiation, ion beam emission, and results in larger pinching plasma inductance. The Lee model suggests that the increase in the pinching plasma inductance can be explained by the occurrence of radiation collapse in the pinch operated with Argon gas. It is postulated that the occurrence of anomalous plasma heating may stop plasma compression and prevent the plasma from a complete collapse to reach near-zero radius.

Item Type: Article
Funders: Sylvia Fedoruk Canadian Center for Nuclear Innovation, Natural Sciences and Engineering Research Council of Canada (NSERC)
Uncontrolled Keywords: Dense plasma focus; Radiation collapse; Anomalous heating
Subjects: Q Science > QC Physics
Depositing User: Ms Zaharah Ramly
Date Deposited: 06 Apr 2022 02:21
Last Modified: 06 Apr 2022 02:21
URI: http://eprints.um.edu.my/id/eprint/26955

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