Determination of Traps' Density of State in OLEDs from Current–Voltage Analysis

Zaini, M.S. and Sarjidan, M.A.M. and Majid, W.H.A. (2016) Determination of Traps' Density of State in OLEDs from Current–Voltage Analysis. Chinese Physics Letters, 33 (1). 018101. ISSN 0256-307X, DOI

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A simple method to determine the traps density of state (DOS) in organic light-emitting diodes (OLEDs) by manipulating the current-voltage (I-V ) characteristic of the devices at room temperature is introduced. In particular, the trap-dependent space-charge limited current formula is simplified to obtain effective density of traps. In this study, poly[(9,9-di-n-octylfluorenyl-2,7-diyl)-alt-(benzo[2,1,3]thiadiazol-4,8-diyl)] (F8BT) and 2- Methoxy-5-(37dimethyloctyloxy) benzene-1,4-diacetonitrile (OC1C10-PPV) are selected as the OLEDs emissive layer. The trap DOS of F8BT- and OC1C10-PPV-based OLEDs are calculated in the magnitudes of 1024 m-3 and 1023 m-3, respectively. In addition, the results agree with the other conventional method which is used to determine the trap DOS in OLEDs. This calculation technique may serve as a robust and reliable approach to obtain the trap DOS in OLEDs at room temperature.

Item Type: Article
Uncontrolled Keywords: Traps' Density; OLEDs; Current-Voltage Analysis
Subjects: Q Science > Q Science (General)
Q Science > QC Physics
Divisions: Faculty of Science
Depositing User: Ms. Juhaida Abd Rahim
Date Deposited: 16 May 2018 07:37
Last Modified: 16 May 2018 07:37

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