Nasir, Farah Hannan Abd and Woon, Kai Lin (2024) Charge carrier trapping in organic semiconductors: Origins, impact and strategies for mitigation. Synthetic Metals, 307. p. 117661. ISSN 0379-6779, DOI https://doi.org/10.1016/j.synthmet.2024.117661.
Full text not available from this repository.Abstract
Charge carrier traps are discrete states within organic semiconductors with the propensity to capture and hold onto electrons or holes, thereby hindering their contribution to electrical conductivity and frequently diminishing device performance. Despite extensive research into charge-trapping mechanisms, the precise origins of these trap states remain elusive. This review endeavours to bridge this knowledge gap by compiling a range of factors identified as instrumental in the genesis of traps. The review commences with an introductory overview of organic semiconductors and a definition of charge carrier traps. Subsequently, we delve into an examination of the myriad origins of trap states and their impact on the function of organic electronic devices culminating with a discussion of various approaches devised to mitigate the effects of charge carrier trapping. This includes an exploration of the potential for harnessing charge carrier traps within the realms of artificial intelligence and neuromorphic computing.
| Item Type: | Article |
|---|---|
| Funders: | University of Malaya Impact-Oriented Interdisciplinary Research Grant Programme (IIRG0 05 A- 19 FNW) |
| Uncontrolled Keywords: | Traps; Organic semiconductors; Origin; Devices |
| Subjects: | Q Science > Q Science (General) Q Science > QC Physics |
| Divisions: | Faculty of Science > Department of Physics |
| Depositing User: | Ms. Juhaida Abd Rahim |
| Date Deposited: | 17 Sep 2024 02:27 |
| Last Modified: | 17 Sep 2024 02:27 |
| URI: | http://eprints.um.edu.my/id/eprint/45098 |
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