Al-Ta'ii, Hassan M. Jaber and Ijam, Ali (2022) Investigating the impact of alpha particles energy level on the DNA-Schottky diode behavior. Physica B-Condensed Matter, 640. ISSN 0921-4526, DOI https://doi.org/10.1016/j.physb.2022.414004.
Full text not available from this repository.Abstract
In this work, the influence of the alpha energy level on the Al/DNA/Al Schottky diode was examined through J-V curve. The diodes were exposed to alpha radiation energy ranging from 0.625 MeV to 5.485 MeV under the same irradiation time. Diode parameters, such as series and shunt resistance, were determined by using a conventional method. The current density and electrical conductivity were also tested. From the results, it is observed that the series resistance for the irradiated samples is found to be higher than the non-radiated one, and its behavior is approximately equivalent to the hypersensitivity phenomena. The current density, for all samples, increases with increasing the electric field. Furthermore, the electrical conductivity of the non-radiated sample was higher than the alpha irradiated samples at a voltage of 6.0 V. These results highlight the significance of using this device as a detector for alpha particles' radiation in bioelectronics applications.
| Item Type: | Article |
|---|---|
| Funders: | None |
| Uncontrolled Keywords: | Schottky diode; Alpha particles; Electrical field; Conductivity; Series resistance |
| Subjects: | Q Science > QC Physics T Technology > TJ Mechanical engineering and machinery |
| Divisions: | Faculty of Engineering > Department of Mechanical Engineering Faculty of Science > Department of Physics |
| Depositing User: | Ms. Juhaida Abd Rahim |
| Date Deposited: | 26 Oct 2023 09:04 |
| Last Modified: | 26 Oct 2023 09:04 |
| URI: | http://eprints.um.edu.my/id/eprint/41707 |
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