Abo-Hassan, Khedr M.M. and Muhamad, Muhamad Rasat and Radhakrishna, S. (2005) Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation. Physica B: Condensed Matter, 358 (1-4). pp. 256-264. ISSN 0921-4526, DOI https://doi.org/10.1016/j.physb.2005.01.422.
Full text not available from this repository.Abstract
ZnSxSe1-x thin films were prepared by electron beam evaporation. The samples were investigated by using energy dispersion X-ray analysis (EDXA), scanning electron microscopy (SEM) and X-ray diffraction (XRD). The results implied that the film composition deviates from the theoretical stoichiometric and that excess of S was formed as grain boundaries. The XRD profiles showed that the films are polycrystalline with cubic structure grown preferentially along the 〈1 1 1〉 axis. The lattice parameter of the cubic structure varied linearly with the film composition according to Vegard's Law. Most of the samples experienced tensile stress while some of them exhibited compressive stress. © 2005 Elsevier B.V. All rights reserved.
| Item Type: | Article |
|---|---|
| Funders: | UNSPECIFIED |
| Uncontrolled Keywords: | Thin films; Lattice parameter; Micro-strain |
| Subjects: | Q Science > Q Science (General) Q Science > QC Physics |
| Divisions: | Faculty of Science > Department of Physics |
| Depositing User: | Ms. Juhaida Abd Rahim |
| Date Deposited: | 29 May 2020 01:49 |
| Last Modified: | 29 May 2020 01:49 |
| URI: | http://eprints.um.edu.my/id/eprint/24460 |
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