Reflection spectra of etched FBGs under the influence of axial contraction and stress-induced index change

Yang, H.Z. and Lim, K.S. and Qiao, X.G. and Chong, W.Y. and Cheong, Y.K. and Lim, W.H. and Lim, W.S. and Ahmad, Harith (2013) Reflection spectra of etched FBGs under the influence of axial contraction and stress-induced index change. Optics Express, 21 (12). pp. 14808-14815. ISSN 1094-4087, DOI https://doi.org/10.1364/OE.21.014808.

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Abstract

We present a new theoretical model for the broadband reflection spectra of etched FBGs which includes the effects of axial contraction and stress-induced index change. The reflection spectra of the etched FBGs with several different taper profiles are simulated based on the proposed model. In our observation, decaying exponential profile produces a broadband reflection spectrum with good uniformity over the range of 1540-1560 nm. An etched FBG with similar taper profile is fabricated and the experimental result shows good agreement with the theoretical model.

Item Type: Article
Funders: UNSPECIFIED
Uncontrolled Keywords: Reflection spectra; Etched FBGs; Axial contraction; Stress-induced index change
Subjects: Q Science > QC Physics
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Science > Department of Physics
Depositing User: Ms. Juhaida Abd Rahim
Date Deposited: 30 Oct 2015 02:09
Last Modified: 11 Oct 2018 02:47
URI: http://eprints.um.edu.my/id/eprint/14412

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