Hasan, M.M. and Haseeb, A.S. Md. Abdul and Saidur, Rahman and Masjuki, Haji Hassan (2008) Effects of annealing treatment on optical properties of anatase TiO2 thin films. International Journal of Chemical and Biological Engineering, 1. pp. 1-5. ISSN 2010-3867,
Full text not available from this repository.Abstract
In this investigation, anatase TiO2 thin films were grown by radio frequency magnetron sputtering on glass substrates at a high sputtering pressure and room temperature. The anatase films were then annealed at 300-600 °C in air for a period of 1 hour. To examine the structure and morphology of the films, X-ray diffraction (XRD) and atomic force microscopy (AFM) methods were used respectively. From X-ray diffraction patterns of the TiO 2 films, it was found that the as-deposited film showed some differences compared with the annealed films and the intensities of the peaks of the crystalline phase increased with the increase of annealing temperature. From AFM images, the distinct variations in the morphology of the thin films were also observed. The optical constants were characterized using the transmission spectra of the films obtained by UV-VIS-IR spectrophotometer. Besides, optical thickness of the film deposited at room temperature was calculated
Item Type: | Article |
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Funders: | UNSPECIFIED |
Uncontrolled Keywords: | Titanium dioxide; RF reactive sputtering; Structural properties; Surface morphology; Optical properties |
Subjects: | T Technology > TA Engineering (General). Civil engineering (General) T Technology > TJ Mechanical engineering and machinery |
Divisions: | Faculty of Engineering |
Depositing User: | Mr Jenal S |
Date Deposited: | 09 Jul 2013 01:02 |
Last Modified: | 25 Oct 2019 06:05 |
URI: | http://eprints.um.edu.my/id/eprint/6864 |
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