Goh, Yi Sing and Goh, Yingxin and Chia, Pay Ying and Haseeb, A. S. M. A. (2021) Formation and nanomechanical properties of intermetallic compounds in electrodeposited Cu-Sn-Co multilayers. Journal of Materials Science: Materials in Electronics, 32 (7). pp. 9490-9499. ISSN 0957-4522, DOI https://doi.org/10.1007/s10854-021-05612-3.
Full text not available from this repository.Abstract
The properties of the intermetallic compounds (IMCs) formed at the interface between the solder and the Under Bump Metallization (UBM) are crucial for the reliability of solder joints. Cobalt (Co) is a potential candidate for UBM since it can act as a diffusion barrier and hence can improve the performance of tin-based solder joints. Growth kinetics, mechanism of formation, and properties of IMC in the copper-tin-cobalt (Cu-Sn-Co) system that is encountered with Co UBM are presented in this paper. Cu-Sn-Co systems were prepared by electrodeposition of Cu, Sn and Co multilayers on Cu substrates followed by reflow at 250 degrees C for varying durations (1-30 min). Microscopic observation revealed the formation of defect-free (Co,Cu)Sn-3, crack-containing (Cu,Co)(6)Sn-5 and thin irregular Cu3Sn IMCs after 1 min reflow. As reflow duration increased, (Co,Cu)Sn-3 and Cu3Sn grew at the expense of (Cu, Co)(6)Sn-5. The consumption of the entire Sn layer after 1 min and the calculated effective interdiffusion coefficient of (Co,Cu)Sn-3 suggested that the growth of (Co,Cu)Sn-3 after 1 min is controlled by solid-state diffusion of Sn. The average Young's Modulus values of (Co,Cu)Sn-3, (Cu,Co)(6)Sn-5 and Cu3Sn are 99.5 +/- 3.2 GPa, 110.8 +/- 7.3 GPa and 109.4 +/- 0.3 GPa, respectively, while the nanohardness values are 4.15 +/- 0.34 GPa, 6.74 +/- 0.62 GPa and 4.96 +/- 1.09 GPa, respectively. Increasing the reflow duration in the Cu-Sn-Co system is expected to improve the performance of the solder joint, through the replacement of the crack-containing (Cu,Co)(6)Sn-5 by the defect-free (Co,Cu)Sn-3.
| Item Type: | Article |
|---|---|
| Funders: | UNSPECIFIED |
| Uncontrolled Keywords: | Properties of the intermetallic compounds; Electrodeposited Cu-Sn-Co multilayers |
| Subjects: | T Technology > TA Engineering (General). Civil engineering (General) T Technology > TJ Mechanical engineering and machinery |
| Divisions: | Faculty of Engineering |
| Depositing User: | Ms. Juhaida Abd Rahim |
| Date Deposited: | 07 Mar 2022 08:33 |
| Last Modified: | 07 Mar 2022 08:33 |
| URI: | http://eprints.um.edu.my/id/eprint/26481 |
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