Items where Author is "Mahmoud, Mohamed Mounir"

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Item Type | No Grouping
Jump to: Article
Number of items: 1.

Article

Mahmoud, Mohamed Mounir and Soin, Norhayati (2019) A comparative study of lifetime reliability of planar MOSFET and FinFET due to BTI for the 16 nm CMOS technology node based on reaction-diffusion model. Microelectronics Reliability, 97. pp. 53-65. ISSN 0026-2714, DOI https://doi.org/10.1016/j.microrel.2019.03.007.

This list was generated on Thu Mar 28 21:41:31 2024 +08.