Annealing effect on the structural and optical properties of embedded au nanoparticles in silicon suboxide films

Chan, K. and Goh, B.T. and Rahman, S.A. and Muhamad, M.R. and Dee, C.F. and Aspanut, Z. (2012) Annealing effect on the structural and optical properties of embedded au nanoparticles in silicon suboxide films. Vacuum, 86 (9). pp. 1367-1372. ISSN 0042207X

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Abstract

Au/SiO x nanocomposite films have been fabricated by co-sputtering Au wires and SiO 2 target using an RF magnetron co-sputtering system before the thermal annealing process at different temperatures. The structural and optical properties of the samples were characterized using X-ray photoelectron spectroscopy (XPS), field emission scanning electron microscopy (FESEM), Fourier transform infrared spectroscopy (FTIR), optical transmission, and reflection spectroscopy. XPS analysis confirms that the as-prepared SiO x films are silicon-rich suboxide films. FESEM images reveal that with an increase in annealing temperature, the embedded Au NPs tend to diffuse toward the surface of the SiO x films. In IR spectra, the intensity of the Si-O-Si absorption band increases with the annealing temperature. Optical spectra reveal that the position and intensity of the surface plasmon resonance (SPR) peak are dominated by the effect of the inter-particle distance and size of the Au NPs embedded in the SiO x films, respectively. The SPR absorption peak shows the blue-shift from 672 to 600 nm with an increase in annealing temperature. The growth of silica nanowires (SiO x NWs) is observed in the film prepared on a c-Si substrate instead of a quartz substrate and annealed at temperatures of 1000 °C. © 2012 Elsevier Ltd. All rights reserved.

Item Type: Article
Uncontrolled Keywords: Gold nanoparticle Plasmonics Silica nanowires Surface plasmon resonance Absorption peaks Annealing effects Annealing temperatures Au nanoparticle Blue shift c-Si substrates Cosputtering Field emission scanning electron microscopy Fourier transform infrared (FTIR) spectroscopies Gold Nanoparticles Interparticle distances IR spectrum Optical spectra Quartz substrate Reflection spectroscopy Rf-magnetron co-sputtering Silicon suboxide films Structural and optical properties Surface plasmon resonance (SPR) Thermal annealing process X ray photoelectron spectroscopies (XPS) XPS analysis Annealing Field emission microscopes Film growth Film preparation Fourier transform infrared spectroscopy Gold alloys Nanowires Optical properties Quartz Silicon Silicon compounds Silicon oxides X ray photoelectron spectroscopy Gold
Subjects: Q Science > QC Physics
Divisions: Faculty of Science > Dept of Physics
Depositing User: miss munirah saadom
Date Deposited: 15 Jul 2013 03:45
Last Modified: 02 Jan 2015 03:16
URI: http://eprints.um.edu.my/id/eprint/7316

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