Structural, optical and morphological properties of TiO∕ Ag∕ TiO multilayer films

Hasan, M.M. and Haseeb, A.S. Md. Abdul and Saidur, Rahman and Masjuki, Haji Hassan and Johan, Mohd Rafie (2009) Structural, optical and morphological properties of TiO∕ Ag∕ TiO multilayer films. In: AIP Conference Proceedings, 2009, Shah Alam, Selangor (Malaysia).

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In this investigation, TiO2/Ag/TiO2 multilayer‐films were deposited on microscope glass slides with varying individual layer thicknesses by radio‐frequency reactive magnetron sputtering. Prior to multilayer development, single layers of Ag and TiO2 were deposited and characterized. All the films were prepared at a moderately high pressure at room temperature. It was found that single layer of TiO2 showed anatase polycrystalline structure. It also exhibited high visible transmittance of above 80% and higher refractive index of 2.31 at a wavelength of 550 nm. The indirect optical band gap of the TiO2 films was estimated as 3.39 eV. The Ag single layer films were found to be crystalline with a very high reflectance for IR (Infra‐red) light. Finally, the multilayers have been deposited and characterized by X‐ray diffraction, UV‐visible‐IR spectrophotometry, scanning electron microscopy and profilometry.

Item Type: Conference or Workshop Item (Paper)
Uncontrolled Keywords: Nanotubes, X-ray diffraction, Analytical methods involving vibrational spectroscopy.
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
T Technology > TJ Mechanical engineering and machinery
Divisions: Faculty of Engineering
Depositing User: Mr Jenal S
Date Deposited: 08 Jul 2013 02:17
Last Modified: 26 Sep 2019 09:22

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