El-Raheem, M.M.A. and El-Husainy, N.M. and Ali, Hapipah Mohd (2009) Optical and electrical measurements on electron beam evaporated cdte thin films. Optoelectronics and Advanced Materials-Rapid Communications, 3 (6). pp. 533-538. ISSN 1842-6573,
Full text not available from this repository.Abstract
Thin films of CdTe with different film thickness have been grown on glass substrates with different film thickness by electron beam evaporation technique. The influences of the thickness and annealing temperature on the structural, optical and electrical characteristics of CdTe films have been investigated. The structure of the deposited CdTe films was of the zinc-blend type with a preferential orientation of (111) planes. The optical transmittance of these films was determined using a double beam spectrophotometer. All the spectra reveal interference fringes in the wavelength region from 820 to 2500 nm. The refractive index, n was calculated from the transmission spectra using the Swanepoel's method. The electrical resistivity measurements were carried out using the two-terminal configuration in air. High resistive CdTe films have been obtained after annealing at the temperature 400 degrees C.
| Item Type: | Article |
|---|---|
| Funders: | UNSPECIFIED |
| Additional Information: | Department of Chemistry, Faculty of Science Building, University of Malaya, 50603 Kuala Lumpur, MALAYSIA |
| Uncontrolled Keywords: | Thin films; Structure properties; Transmittance; Refractive index; Electrical resistivity |
| Subjects: | Q Science > QD Chemistry |
| Divisions: | Faculty of Science > Department of Chemistry |
| Depositing User: | Miss Malisa Diana |
| Date Deposited: | 05 Apr 2013 01:56 |
| Last Modified: | 29 Jan 2019 08:33 |
| URI: | http://eprints.um.edu.my/id/eprint/5401 |
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