An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials

Al-Samarraay, Mohammed and Al-Zuhairi, Omar and Alamoodi, A. H. and Albahri, O. S. and Deveci, Muhammet and Alobaidi, O. R. and Albahri, A. S. and Kou, Gang (2024) An integrated fuzzy multi-measurement decision-making model for selecting optimization techniques of semiconductor materials. Expert Systems with Applications, 237 (B). ISSN 1873-6793, DOI https://doi.org/10.1016/j.eswa.2023.121439.

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Official URL: https://doi.org/10.1016/j.eswa.2023.121439

Abstract

Semiconductor materials play a crucial role in the development of optoelectronics and power devices. However, their evaluation and selection pose a multi-attribute decision-making problem. This problem encompasses various considerations, such as multiple evaluation criteria, data variation, and the importance of criteria multiplicity. Therefore, this study proposes an integrated fuzzy multi-measurement decision-making model (IFMMDMM) to evaluate and select optimization techniques for semi-polar III-V semiconductor materials. The research methodology is designed based on three sequential phases. Firstly, four optimization techniques for semi-polar III-V semiconductor materials and four evaluation criteria are identified to construct the evaluation decision matrix. Secondly, the fuzzy-weighted zero-inconsistency method is developed to evaluate and assign weights to the defined multi-measurement criteria. Thirdly, the fuzzy decision by opinion score method is developed to select the optimization techniques for semi-polar III-V semiconductor materials. The weighting results reveal that the highest weight value was assigned to `root mean square under surface morphology' (0.1382), while `peak-to-valley under surface morphology' received the lowest weight value (0.1074). The selection results indicated that `different flux with fixed cycle NH3 treatment (D)' ranked first, whereas `NH3 flux at changing V/III (A)' had the lowest performance order. Systematic and sensitivity ranking assessments were performed to verify the efficiency of the proposed model.

Item Type: Article
Funders: UNSPECIFIED
Uncontrolled Keywords: Semi -polar III -V semiconductor materials; Optimization techniques; Multi-attribute decision-analysis; FWZIC; FDOSM
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Science > Department of Physics
Depositing User: Ms. Juhaida Abd Rahim
Date Deposited: 05 Jul 2024 07:26
Last Modified: 05 Jul 2024 07:26
URI: http://eprints.um.edu.my/id/eprint/44319

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