Roshan, Mahmud Vahdat and Sadeghi, H. and Fazelpour, S. and Lee, Sing and Yap, Seong Ling (2019) Plasma Platform to Investigate Error Structure in the Electronic Components. IEEE Transactions on Plasma Science, 47 (5). pp. 2609-2614. ISSN 0093-3813, DOI https://doi.org/10.1109/TPS.2019.2903938.
Full text not available from this repository.Abstract
This program was designed to introduce a plasma platform to examine the field programmable gate array (FPGA) of the link boards typically used at the CERN's arge Hadron Collider (LHC). Pulsed plasma systems with accelerating gradient of 1 kV mu text{m} generate high-intensity, high-energy radiation beams. Single-event upset (SEU) is caused by radiation deposition in the FPGA. In FPGA, the SEU probability for 1-MeV protons and 10-keV X-rays are 0.1 and 2 × 10{-9} particle {-1}. The number of SEU induced in the Si by 1-MeV proton irradiation at 0.8-V bias computed from simulation in COMSOL Multiphysics was 1.8 × 10{5}. Although more experimental research is needed to identify the underlying mechanisms, pulsed plasma is perceived as being a smart alternative to investigate the error structure in FPGA. © 1973-2012 IEEE.
| Item Type: | Article |
|---|---|
| Funders: | UNSPECIFIED |
| Uncontrolled Keywords: | Bit error rate; error analysis; industrial electronics |
| Subjects: | Q Science > Q Science (General) Q Science > QC Physics |
| Divisions: | Faculty of Science > Department of Physics |
| Depositing User: | Ms. Juhaida Abd Rahim |
| Date Deposited: | 03 Feb 2020 02:16 |
| Last Modified: | 03 Feb 2020 02:16 |
| URI: | http://eprints.um.edu.my/id/eprint/23635 |
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