Defect detection based on extreme edge of defective region histogram

Wakaf, Zouhir and Jalab, Hamid Abdullah (2018) Defect detection based on extreme edge of defective region histogram. Journal of King Saud University - Computer and Information Sciences, 30 (1). pp. 33-40. ISSN 1319-1578, DOI https://doi.org/10.1016/j.jksuci.2016.11.001.

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Official URL: https://doi.org/10.1016/j.jksuci.2016.11.001

Abstract

Automatic thresholding has been used by many applications in image processing and pattern recognition systems. Specific attention was given during inspection for quality control purposes in various industries like steel processing and textile manufacturing. Automatic thresholding problem has been addressed well by the commonly used Otsu method, which provides suitable results for thresholding images based on a histogram of bimodal distribution. However, the Otsu method fails when the histogram is unimodal or close to unimodal. Defects have different shapes and sizes, ranging from very small to large. The gray-level distributions of the image histogram can vary between unimodal and multimodal. Furthermore, Otsu-revised methods, like the valley-emphasis method and the background histogram mode extents, which overcome the drawbacks of the Otsu method, require preprocessing steps and fail to use the general threshold for multimodal defects. This study proposes a new automatic thresholding algorithm based on the acquisition of the defective region histogram and the selection of its extreme edge as the threshold value to segment all defective objects in the foreground from the image background. To evaluate the proposed defect-detection method, common standard images for experimentation were used. Experimental results of the proposed method show that the proposed method outperforms the current methods in terms of defect detection.

Item Type: Article
Funders: UNSPECIFIED
Uncontrolled Keywords: Image segmentation; Automatic thresholding; Defect detection; Otsu method
Subjects: Q Science > QA Mathematics > QA75 Electronic computers. Computer science
T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Computer Science & Information Technology
Depositing User: Ms. Juhaida Abd Rahim
Date Deposited: 21 Feb 2019 02:53
Last Modified: 21 Feb 2019 02:53
URI: http://eprints.um.edu.my/id/eprint/20413

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