Study on the AFM Force Curve Common Errors and Their Effects on the Calculated Nanomechanical Properties of Materials

Almasi, D. and Sharifi, R. and Kadir, M.R.A. and Krishnamurithy, G. and Kamarul, Tunku (2016) Study on the AFM Force Curve Common Errors and Their Effects on the Calculated Nanomechanical Properties of Materials. Journal of Engineering, 2016. pp. 1-8. ISSN 2314-4904, DOI https://doi.org/10.1155/2016/2456378.

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Abstract

The atomic force microscope (AFM) force curve has been widely used for determining the mechanical properties of materials due to its high resolution, whereby very low (piconewton) forces and distances as small as nanometers can be measured. However, sometimes the resultant force curve obtained from AFM is slightly different from those obtained from a more typical nanoindentation force curve due to the AFM piezo’s hysteresis. In this study the nanomechanical properties of either a sulfonated polyether ether ketone (SPEEK) treated layer or bare polyether ether ketone (PEEK) were evaluated via AFM nanoindentation and a nanomechanical test system to probe the possible error of the calculated nanomechanical properties due to the AFM piezo’s hysteresis. The results showed that AFM piezo’s hysteresis caused the error in the calculated nanomechanical properties of the materials.

Item Type:	Article
Funders:	UNSPECIFIED
Uncontrolled Keywords:	AFM Force Curve; Common Errors; Effects; Calculated Nanomechanical; Properties; Materials
Subjects:	R Medicine
Divisions:	Faculty of Medicine
Depositing User:	Ms. Juhaida Abd Rahim
Date Deposited:	14 Jul 2017 03:28
Last Modified:	10 Oct 2018 09:03
URI:	http://eprints.um.edu.my/id/eprint/17505

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