Investigation on structural and electrochemical properties of binder free nanostructured nickel oxide thin film

Duraisamy, N. and Numan, A. and Ramesh, K. and Choi, K.H. and Ramesh, S. and Ramesh, S. (2015) Investigation on structural and electrochemical properties of binder free nanostructured nickel oxide thin film. Materials Letters, 161. pp. 694-697. ISSN 0167-577X

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Official URL: DOI: 10.1016/j.matlet.2015.09.059

Abstract

Here, we report a simple method to achieve binder free nickel oxide (NiO) thin film using an electrohydrodynamic atomization (EHDA) process. The optimization of process parameters to obtain uniform thin film is discussed in detail. The high surface purity of nanostructured NiO film is oriented in the face centered cubic structure. The surface morphology revealed uniform deposition of anisotropic nanoplatelets morphology. The cyclic voltammetry and electrochemical impedance spectroscopy confirm the pseudocapacitance behavior of NiO film with a specific capacitance of 178 Fig. The cyclic test exhibits a good cyclic retention of 94% for 1200 cycles. (C) 2015 Elsevier B.V. All rights reserved.

Item Type: Article
Uncontrolled Keywords: Deposition; Electrohydrodynamic atomization; Thin films; Surface morphology; Electrochemical study
Subjects: Q Science > Q Science (General)
Q Science > QC Physics
Depositing User: Mrs. Siti Mawarni Salim
Date Deposited: 04 Aug 2016 05:09
Last Modified: 04 Aug 2016 05:09
URI: http://eprints.um.edu.my/id/eprint/16172

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