Polarized infrared reststrahlen features of wurtzite ingan thin film

Yew, P.; Lee, S.C.; Ng, S.S.; Yoon, T.T.; Haslan, A.H.; Wei, L.C. (2014) Polarized infrared reststrahlen features of wurtzite ingan thin film. In: 28th Regional Conference on Solid State Science and Technology 2014 (RCSSST 2014)., 25 - 27 November 2014, Cameron Highland, Pahang, Malaysia..

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    Abstract

    Polarized infrared (IR) reflectance measurement was carried out to investigate the optical phonon modes of wurtzite structure Ino.92GaoosN thin film grown by molecular beam epitaxy· Composition dependence of IR reststrahlen features was observed. Theoretical polarized ~ reflectance spectrum was simulated using the standard multilayer optics technique with a multloscillator dielectric function model. By obtaining the best fit of experimental and theoretical spectrum, the Brillouin zone center E, optical phonon modes together with the dielectric constant, layer thickness, free carriers concentration and mobility were extracted non-destructively. The extracted EI optical phonon modes were compared with those generated from modified random element iso-displacement (MREI) model.

    Item Type: Conference or Workshop Item (Lecture)
    Creators:
    1. Yew, P.(Universiti Sians Malaysia)
    2. Lee, S.C.(Universiti Sians Malaysia)
    3. Ng, S.S.(University of Malaya)
    4. Yoon, T.T.(Universiti Sians Malaysia)
    5. Haslan, A.H.(Universiti Sians Malaysia)
    6. Wei, L.C.(National Changhua University of Education, Taiwan)
    Uncontrolled Keywords: Wurtzite InGaN, MREI model, Optical Phonon, Infrared Reflectance.
    Subjects: Q Science > Q Science (General)
    Q Science > QC Physics
    Divisions: Faculty of Science > Dept of Physics
    Depositing User: Mr. Mohd Safri
    Date Deposited: 20 Jun 2016 08:55
    Last Modified: 20 Jun 2016 08:55
    URI: http://eprints.um.edu.my/id/eprint/15939

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